Product category

Metrology

Buyer's guide > Instrumentation & measurement > Metrology

Showing products 61 to 80 of 274 in Metrology.
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61. New External Portable Hard Drive Media Player with Wireless LAN
    Hdd Enclosure Aug 10, 2009

    The hard drive media players connects to your wireless access point,thereby opening a new world of multimedia entertainment.

62. Four Channels D1 Decode Card
    Dailianxu Engineering Co.,Ltd Jul 28, 2009

    Should be used together with desk-top computer, single card can realized 4 channels D1 decode, one PC can support up to 32 channels

63. SI-TORO® digital pulse processing
    Southern Innovation Jul 23, 2009

    Southern Innovation's SITORO® digital pulse processing technology is the super-efficient, multi-channel analyser for high-performance applications

64. Contamination-free high precision optics
    Optical Surfaces Ltd. Jul 22, 2009

    Optical Surfaces Ltd. has announced investment in a new class 10,000 clean room facility.

65. Lens adapters produce high resolution images with minimal distortion
    Resolve Optics Ltd. Jul 22, 2009

    For applications that require changing the field of view or image format of a lens - Resolve Optics Ltd. has developed a reputation for designing & supplying high performance specialist lens adapters

66. Nanosurf easyScan 2 FlexAFM - Your versatile AFM for Materials and Life Science
    Windsor Scientific Ltd Jul 13, 2009

    The FlexAFM brings a new dimension to the easyScan line of SPMs: adding new AFM modes, liquid imaging, ultra-flat scanning, all with the renowned ease-of-use of the Nanosurf range.

67. High-Speed Framing Camera Expands Boundaries Of Research
    Specialised Imaging Ltd. Jul 13, 2009

    The SIM02 framing camera from Specialised Imaging Ltd. offers the ultimate in ultra high-speed imaging performance.

68. Versatile Radiation Controller for Industry and Science
    Scitec Instruments Ltd Jul 13, 2009

    Scitec Instruments has introduced the RADIKON radiation controller, which provides control according to the output from a sensor

69. Q-View White Light Interferometer / SPM
    Ambios Technology Inc Jul 10, 2009

    Q-View is a Dual Technology System featuring SPM / Interferometry on a single platform. Sub-angstrom imaging and metrology in SPM mode. Large FOV high speed scanning in interferometric mode.

70. Introducing the Nano-LPS Series: Slim piezo nanopositioner for SR microscopy
    Mad City Labs, Inc. Jul 7, 2009

    The Nano-LPS Series of highly stable piezo nanopositioners are slim (20mm), 83mm centre aperture, picometer precision and up to 300 microns of travel in XYZ. Ideal for super resolution microscopy.

71. Ultra-Low-Noise Single Photon Detector
    SmartQuantum Inc Jun 26, 2009

    The SQLightSensor is a ultra low noise near infrared NIR Single Photon Detector based on a Geiger-mode InGaAs avalanche photodiode and a internal thermoelectrically cooler.

72. High-resolution Carbon Nanotube (CNT) probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (CDI) Jun 17, 2009

    The CCHR high-resolution CNT AFM probes are designed for detailed imaging in metrology and materials science applications.

73. CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM)
    Carbon Design Innovations, Inc. (CDI) Jun 17, 2009

    The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications.

74. Blue Single-Frequency Low-Noise DPSS Laser
    Scitec Instruments Polska Jun 4, 2009

    A blue DPSS laser from Oxxius, emitting up to 50 mW at 473 nm, is now available from Scitec Instruments Polska.

75. Multichannel Digital Lock-in Amplifier
    Scitec Instruments Ltd May 27, 2009

    Scitec Instruments has introduced the 450DV2 multichannel digital lock-in amplifier which enables simultaneous processing of up to 16 signals

76. SIB2316 Sensor Interface Board for SensL SPMArray
    Vertilon Corporation May 8, 2009

    The SIB2316 silicon photomultiplier interface board provides the connectivity between two SensL SPMArrays & external signal processing electronics such as a Vertilon PhotoniQ data acquisition system.

77. Launching the MM-16 NIR, New Spectroscopic Ellipsometer
    HORIBA Jobin Yvon May 6, 2009

    The MM-16 NIR spectroscopic ellipsometer is dedicated to thin film characterisation determining thickness, optical constants n,k & optical bandgap of materials in the wavelength range 515-1000nm.

78. New Yb CW laser system for laser cooling and trapping
    Menlo Systems Apr 30, 2009

    Menlo Systems GmbH (Germany), manufacturere of frequency comb systems and femtosecond fiber lasers, and Koheras A/S (Denmark) manufacturer of white light fiber laser systems and DFB fiber lasers,

79. Thin Film Thickness Measurement for Sub-micron Samples from Elliot Scientific
    Elliot Scientific Ltd. Apr 22, 2009

    Thin film thickness measurement on flat panel displays, MEMS and other semicon devices is a common requirement, so Elliot Scientific is now offering the new QDI 2010 Film microspectrophotometer.

80. Introducing HORIBA Scientific
    HORIBA Jobin Yvon Apr 22, 2009

    HORIBA Scientific is the new global team created to better meet customers’ present and future needs by integrating the scientific market expertise and resources of HORIBA.

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