Simulating ion beam, plasma and sputter coating devices using Opera
Oct 23, 2013
Sponsored by Cobham
The ability to model the interaction of charged particles with electromagnetic fields is critical for obtaining optimum performance from a wide range of devices, be they X-ray tubes or flat-screen displays, ion sources or particle accelerators.
The Opera software suite has included this capability for a number of years, with continual enhancements. In this webinar, Mike Hook discusses the modelling of space-charge-limited emission and particle tracking using Opera, including coupled multiphysics, and introduces the latest enhancement – the simulation of magnetron sputtering.
The webinar illustrates Opera's charged-particle simulation capability using a number of devices drawn from a range of application areas.
Date: Wednesday 23 October 2013
Speaker: Mike Hook, senior applications engineer, Cobham Technical Services
Mike Hook has degrees in physics and microwaves from Imperial and University Colleges, London. Over the last 30 years, he has worked in the design and development of microwave, optical, infrared and particle-beam devices. He joined Cobham in 1992 and currently specializes in charged-particle and high-frequency applications of the Opera software.
Moderator: Tushna Commissariat, reporter, physicsworld.com