Bending and stretching nanotubes
(Top left) An atomic force microscope (AFM) image of a multiwall nanotube across a pore. The AFM can also be used to apply a force to the nanotube and measure how much it bends, which allows the Young's modulus to be determined. (J-P Salvetat et al. 1999 Adv. Mat. 11 161; Phys. Rev. Lett. 82 944) (Bottom and right) Scanning electron microscope images of a multiwall nanotube held between two AFM tips. When the tips are pulled apart the outermost layer of the nanotube ruptures (see Yu et al. in further reading).