SPM 1000 Universal SPM Control System

Four Independent, Cryogenic, Atomic-Resolution Probes

A true low-temperature (10K) UHV 4-Probe system is one of a family of multi-probe UHV SPM systems made possible by RHK Technology. This system provides a complete multi-technique, multi-chamber UHV system and includes all control electronics and software required for a full range of research applications. The base system provides a combination cryogenic 4-probe scanning probe microscope (SPM), an integral scanning electron microscope (SEM), sample preparation, and load-lock introduction for probes and samples. Various optional SEM and surface analysis packages, such as scanning Auger microprobe (SAM), are also available to customize your system for specific research needs.

The Only True Universal SPM Controller

RHK's experience, broad application base, and continuing collaboration with leading research groups worldwide, are combined in this latest version of the unique SPM 1000 control system.

Data and Technique

Four probes over an integrated circuit (SEM)
 

Carbon nanotube manipulated by applying electric current (SEM)

STM of Si(111) with a 7x7 reconstruction
 

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UHV AFM/STM SEM

As nanotechnology continues to blossom the need to study small particles on an atomic scale grows in importance. The fundamental problem to solve is how to place your AFM/STM probe over the feature quickly and efficiently. A few years ago, this was accomplished using a high-magnification video camera to direct the tip to the location of interest. However, this technique is unuseable when features are less than a few micrometers.

Introducing the solution to this problem, an integrated SEM column with the world-leading AFM/STM model, the RHK Technology UHV350 SPM. Spend your valuable time doing research and not on a hunting expedition.

System Advantages

• Integrated SEM for Swift, Efficient Probe Positioning
• Beetle-Design Scan Head: Inherently Stiff, Mechanically and Thermally Stable
• VT Extremes from 25 K to 1500 K
• Highly Evolved SPM Control System
• Modular Analytical and Sample Preparation Options

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Integrated UHV Variable Magnetic Force

RHK brings affordable magnetic capability with uncompromised UHV AFM/STM VT performance.

Equipped with a variable magnetic field at a fraction of the cost of a typical system, RHK's new VMF delivers a magnetic field in plane with the sample and variable to 3000 gauss and beyond.

Five Key Features

• Ability to vary the magnetic field while imaging in real-time without retracting the probe.
• Over 3000 gauss in plane with sample size of 1 cm.
• Electromagnets provide reversible and continuously variable field.
• Easily reproducible field strength across multiple samples and runs.
• No compromise in resolution, drift, stability, and vibration isolation.

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