SPM 1000 Universal SPM Control System

The World's Standard in Flexibility and Performance

RHK's experience, broad application base, and continuing collaboration with leading research groups worldwide, are combined in this latest version of the unique SPM 1000 control system. The system architecture is designed by researchers to meet today's requirements while providing upgrade expansion for the continuously changing needs of the SPM scientist.

The Only True Universal SPM Controller

RHK's experience, broad application base, and continuing collaboration with leading research groups worldwide, are combined in this latest version of the unique SPM 1000 control system.

FEATURES of SPM 1000 Rev 8.5

• Control ANY SPM (open new window)
• Unlimited Data Aqcuisition (open new window)
• Lowest Noise (open new window)
• XPMPro™ Software (open new window)
• Complete Signal Access (open new window)
• Full Documentation and Support (open new window)

UPGRADING to Rev 8.5

• XPMPro™ vs. SPM32 (open new window)
• Streamlined Upgrade (open new window)

XPMPro 2.0 SPM Software

The true scientific work of interpretation and understanding begins after data has been acquired. XPMPro offers feature-filled analysis and processing techniques that will powerfully illustrate every hidden and novel feature awaiting discovery in your data. XPMPro is replete with the professional tools that make a seamless transition from acquisition to publication.

Analysis Tools

Powerful analysis functions display friction and topography data in both scan directions, plotted from exact cross sections that are user-drawn on the image.

RHK's Continuing Commitment to SPM Software Development

The XPMPro revolution continues with the first full-scale upgrade of our premier SPM data acquisition software. Now in beta development, XPMPro 2.0 is a major advance in power, function, and usability. With version 2.0, RHK is renewing its commitment to high-performing technology that is always engineered by customer need and the latest research demand.

Enhancements

1. (open new window)

   Look and Feel. XPMPro™ 2.0 will get a face lift and reorganized controls to make the operation more intuitive, enabling even beginning users to access and utilize the advanced functionality that has made XPMPro the favorite of advanced researchers.

   
   
2. (open new window)

   Dynamic Data Oversampling. When enabled, acquisition board will run at its maximum sampling rate and average all readings between pixels. At present XPMPro only takes one reading per pixel. Oversampling will yield better S/N, especially when scanning slowly.

   
   
3. (open new window)

   Spectroscopic Drift Correction. When enabled, software will automatically correct for drift in all three axis between multiple spectroscopy curves taken at the same location. At present XPMPro can correct for drift between curves only in the Z axis. Exact location of spectroscopic measurement will be stored with each curve.

   
   
4. (open new window)

   Workspace Sessions. This function will save all open windows in the DAW and store it in one file, called a session. When you reopen that session, all windows will return to their original position so you can start where you left off processing and analysis. This session file can also be emailed to collaborators.

   
   

Read More (open new window)

PLLPro Next Generation AFM Control

The Next-Generation Universal AFM Control Platform for Serious SPM Research

The PLLPro is more than a high-performance universal AFM controller. It's an open, modular, and multifunctional experimental platform:

A contact and a non-contact AFM controller bundled as one; the PLLPro can simultaneously measure STM, static AFM deflection, and the oscillation properties of the resonating cantilever. Its fully-digital PLL circuit performs amplitude and phase detection, and a DSP processor calculates the drive amplitude and PLL tracking signals. The user can select in software which data channel the microscope will use for z-feedback control. Multiple power supplies are provided to power external circuitry such as preamplifiers, interferometers, laser diode supplies,etc.