LOT Oriel Apr 1, 2009

Products from this company

1. Rent a Thermal Imaging Camera from LOT May 16, 2012

   Renting is ideal for short-term applications, pre-purchase evaluation, or to temporarily replace a thermal imaging camera that's in for service.

2. LOT Oriel UK teams up with Andor Technology Apr 3, 2012

   LOT UK is pleased to announce that it is now an official distributor for Andor Technology in the UK.

3. LOT launch the IBIS Nanoindentation Tester from Fischer Cripps in the UK Nov 14, 2011

   IBIS is a precision nanoindentation tester offering traceable calibration, robust design, closed loop operation, solid theoretical base, and unmatched accuracy, reliability and price.

4. Summer Sale on all ILT Light Meters and Detectors 10% off until End August 2011 Jul 7, 2011

   (offer only available in UK/Ireland) LOT are offering 10% off all ILT Light Meters and Detectors until the end of August 2011.

5. Excitation Wavelength Selection with a Flick of the Thumb Jun 27, 2011

   New WITec Multi-wavelength Coupling Unit for the alpha300 and alpha500 series.

6. Andover's Optical Filters – Prices have been greatly reduced on all filters Jun 20, 2011

   Optical Filters For Aerospace, Medical, Machine Vision, Astronomy, Space-borne and Defence Systems We now accept VISA, VISA Debit, Mastercard and VISA Electron for these products.

7. LOT Metrology Promotions on Stylus/Optical Surface Profilers and AFMs Jun 9, 2011

   LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period:-

8. LOT launch a new online Light Source Catalogue Jun 7, 2011

   Our expertise in offering the complete solution...

9. A Low Cost Solar Simulator from Abet Technologies May 16, 2011

   - complete system with 35mm beam size & AM 1.5G filter included

10. The widest choice of Stylus and Optical Profiling tools available today Jun 29, 2010

    LOT are proud to be recently appointed as the UK/Ireland distributor for KLA Tencor Stylus & Optical Surface Profilers.

11. NEW Quantum Design PPMS EverCool-II™ – cryogen-free cooling technology May 19, 2010

    The Quantum Physical Property Measurement System (PPMS) EverCool-II™ dewar is the second generation of low-loss dewars with integrated Helium liquefier for the PPMS system from Quantum Design.

12. New LOT Oriel Tips E-Store Now Open May 6, 2010

    Please visit our new store for more details http://www.lot-oriel.com/site/pages_uk_en/products/cantilevers/cantilevers.php

13. Anasys NanoIR – Nanoscale IR spectroscopy and thermal analysis May 6, 2010

    LOT now offer the Nanoscale IR from Anasys Instruments.

14. LOT appointed UK and Ireland distributor for Park Systems AFM instrumentation Apr 1, 2010

    Park Systems – Excellence in Nanometrology

15. The NEW J A Woollam T-Solar™ Ellipsometer Feb 24, 2010

    - Optimised to measure the widest range of Photovoltaic Thin Films

16. Free Two Week Evaluation of the J A Woollam Alpha-SE™ Spectroscopic Ellipsometer Jan 19, 2010

    The new generation Alpha SE™ JA Woollam line of ellipsometers now comes with FOUR angles of incidence for modelling complex layered samples & also an optional liquid cell.

17. LOT offer a new range of standard monochromatic light source packages Jan 18, 2010

    Configuring a complete monochromatic light source with its various options can be a difficult task which is why LOT now offer a range of standard monochromator light source packages.

18. Quantum Design PPMS Scanning Probe Microscopy Inserts Dec 7, 2009

    Our new partner attocube has recently introduced a highly sophisticated yet easy-to-use scanning probe microscope - the new PPMS®-SPM.

19. NEW Abet "Class AAA" Sun 3000 Solar Simulators Dec 3, 2009

    Unrivalled illumination efficiency with comprehensive specification at no extra cost

20. NEW Hydra Probe Series – The world’s first truly hybrid probes Dec 3, 2009

    The HYDRA probe series from APPNANO are the world’s first truly hybrid probes having low stress SILICON NITRIDE CANTILEVERS integrated with single crystal SILICON TIPS.

21. NEW LEJ Light Source for fluorescence excitation in Microscopy Nov 19, 2009

    This compact device is the ideal external light source for fluorescence excitation in microscopy.

22. A NEW comprehensive range of light source packages and accessories from LOT Nov 11, 2009

    Choosing the right light source for a specific application requires a detailed knowledge about the application and specifications regarding sample illumination and modern light source technology.

23. NEW Oculus Single Channel Detectors Sep 24, 2009

    Plug and play USB photodiode detectors/gated optical integrators covering 200 - 1700 nm

24. High-detectivity and high-uniformity Onca IR camera for accurate analysis Sep 16, 2009

    The Onca-640 camera is an affordable midwave infrared imaging camera that is perfect for thermal imaging applications where performance is critical.

25. New Spequest - for Spectral Response Characterisation of Solar Cells May 7, 2009 May 8, 2009

    ·Complete turnkey solution for spectral characterisation ·Modular setup for maximum flexibility ·All type of solar cells: polysilicon, c-Si, mc-Si, nc-Si

26. WITec Project Plus May 8, 2009

    - New Chemometric Software for Raman Spectral and Microscopic Data Analysis

27. The NEW PPMS® DynaCool™ - Cryogen-free Physical Property Measurement System Apr 2, 2009

    System availability: Summer 2010

28. LOT: International Light Technologies - Light Measurement Instrumentation Mar 24, 2009

    LOT represent International Light Technologies in the UK/Ireland for the following products:-

29. New LOT Light Source packages now available from 50-1000W Mar 24, 2009

    LOT have put together new light sources packages for 50-1000W. Many configurations are possible and all packages include required fittings and 2 years warranty.

30. NEW Complete IV Curve Measurement System Feb 27, 2009

    The first class Solar Simulators and probe stations of Abet Technologies are combined with high quality measurement instruments and the ReRa Tracer software.

31. LOT now represent Nanometrics Metrology Systems Feb 18, 2009

    LOT now represent Nanometrics for the following products in the UK/Ireland.

32. Citius Centurio C100 High Speed Camera Feb 18, 2009

    Faster than a bullet – 100,000 frames per second

33. LOT and Andover Corporation - Download or request the new catalogue Feb 2, 2009

    To download or request a catalogue please go to http://www.lot-oriel.com/site/pages_uk_en/products/optical_filters/optical_filters.php. Prices are also available online.

34. The Quantum Design Range of Materials Characterisation Systems Feb 2, 2009

    Register for our workshop at the National Physical Laboratory on Tuesday 17th March 2009

35. New Demonstration Laboratory Facilities at LOT UK Jan 5, 2009

    We will be running demos and events here throughout 2009. To view our diary please go to our website events page http://www.lot-oriel.com/site/pages_uk_en/events/events/events.php

36. The NEW Q-Scope White Light Interferometer/SPM from Ambios Technology Dec 11, 2008

    Q-View is a micro-interferometer module that has been seamlessly integrated into the Q-Scope SPM. This combination provides two synergistic technologies on a single platform

37. The NEW AccuMap® SE from J A Woollam Dec 11, 2008

    for photovoltaic and flat panel display applications

38. The New P960 PPMS™ Helium Reliquefier System from Quantum Design Dec 11, 2008

    Quantum Design (QD) introduces a new way to conserve your liquid helium when operating the Physical Property Measurement System (PPMS).

39. LOT appointed as agents for the Ambios XP-Plus Series of Stylus Profilers May 14, 2008

    World-Class performance combined with exceptional value

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