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Henniker Scientific Ltd. Jan 26, 2012

Components, instruments & systems for UHV, thin film deposition, surface, plasma & gas analysis. - Quadrupole Mass Spectrometers - Ion/Electron/UV/X-Ray Sources - E-Beam & Thermal Evaporators - Plasma Diagnostic Instruments - Custom Systems

Products from this company

  1. Extrel MAX-HM Series, High Mass Quadrupole Mass Spectrometers Feb 14, 2012

    The Extrel MAX-HM Series quadrupole mass spectrometers from Henniker Scientific are now available with extended mass range options to 16,000 amu.

  2. The Tetra Series low pressure plasma surface modification equipment Jan 9, 2012

    The Tetra Series plasma surface modification equipment from Henniker is now available with a range of chamber sizes suitable for both lab development and industrial scale plasma surface treatments.

  3. Pulsed Laser Deposition Systems Jan 9, 2012

    Our Pulsed Laser Deposition Systems combine state-of-the-art functions and features in a compact, versatile platform that would form the centre-piece of any R&D facility.

  4. Thin Film (PVD) Deposition Systems Jan 9, 2012

    Our PVD systems are the very latest concept in cost effective R&D. The TRI-DEP is a multi-technique sputtering/thermal/e-beam evaporation system. The CLAM II is our feature rich sputtering system.

  5. Extrel MAX-UF Series, Ultra-Fast Scanning Mass Spectrometers Dec 7, 2011

    The Extrel MAX-UF Series quadrupole mass spectrometers from Henniker Scientific now feature enhanced scanning mode delivering acquisition speeds in excess of 1000amu/sec.

  6. MAX300-LG MIMS: Membrane Inlet Mass Spectrometer May 12, 2011

    The MAX300-LG Membrane Inlet Mass Spectrometer (MIMS) for the analysis of both gases and dissolved gases in liquids.

  7. MAX300-LG: Quantitative Gas Analyser Mar 28, 2011

    The MAX300-LG is a fully automated Quantitative Gas Analyser for complex gas mixture analysis over the full dynamic range 100% to less than 10ppb.

  8. MAX SIMS: High Specification SIMS Quadrupole Mass Spectrometer Mar 28, 2011

    The MAX-SIMS quadrupole mass spectrometer is a high performance bolt-on instrument for static SIMS, dynamic SIMS, SNMS and depth profiling applications.

  9. MicroVision2 TPD Mass Spectrometer Mar 17, 2010

    Microvision2 is a TPD specific quadrupole mass spectrometer having the fastest, most accurate measurement characterists over the entire dynamic measurement range.

  10. Custom Surface Preparation & Analysis Systems Mar 17, 2010

    Our custom, multi-technique UHV systems combine a wide range of thin film deposition/growth and UHV surface analysis techniques into a single, versatile system that doesn't cost the earth.

  11. RS40B1 twin anode X-Ray Source Mar 17, 2010

    The RS 40B1 UHV X-ray source is a new, high intensity twin anode Al/Mg UHV X-ray source optimised for XPS experiments.

  12. UVS40A2 Ultra-Violet Source for UPS Mar 17, 2010

    Low cost, high intensity UV source for ultraviolet photoelectron spectroscopy. Used & specified by many OEM manufacturers worldwide.

  13. EBV 40A1 Electron Beam Evaporator Mar 17, 2010

    Compact single and multi-cell E-beam evaporator for thin film MBE growth applications.

  14. IS40E1 Focussed Ion Gun for SIMS/XPS Mar 15, 2010

    The IS 40E1 scanning ion source is a two lens extractor type focussed ion gun for depth profiling in SIMS/XPS/ESCA applications.

  15. Ion Flood Gun for Surface Preparation Mar 15, 2010

    The ion flood source IS 40C1 is a compact, easy-to-use UHV extractor type ion source for sample surface cleaning.

  16. ES40C1 Scanning Electron Gun Mar 15, 2010

    The ES40C1 is a low cost focussed electron source for AES, EELS and electron pulse/desorption experiments.

  17. FS40A1 Electron Flood Gun Mar 15, 2010

    The FS 40A1 is a compact, easy to use and reliable electron flood gun source for charge neutralisation of insulators or semiconductors in XPS/AES and SIMS applications.