Aystorm Scientific Ltd Aug 22, 2011
Materials characterisation & surface analysis specialising in ion beam analysis including SIMS, uleSIMS, RBS, Auger, XPS, RBS, FIB/TEM and surface contamination (TOF-SIMS, VPD-TXRF, VPD-ICPMS). Semiconductors, photovoltaics, optical coatings.