Scanning Probe Microscopy short course

The course aims to introduce the principles and practice of the different forms of scanning probe microscopy (SPM). As an outcome, students should understand how the surfaces of various materials can be characterised at nanoscale resolution in terms of topography, friction, atom lattice spacing, elastic modulus, conductivity and other physico-chemical properties. They should be able to select the appropriate mode of SPM for the type of characterisation required. They should be able to interpret the acquired data.