About this event
- Web site
- www.nss-mic.org/20…
- When
- 29 Oct–3 Nov 2012
- Where
- Anaheim, California, United States
- Registration deadline
- May 7, 2012
- Organiser
- IEEE
- Contact address
-
K. Tom Lewellen
University of Washington Medical Center
Seattle
Washington
United States - Tel
- +1 206 543 2365
- Fax
- +1 206 543 8356
- nss2012@u.washington.edu…
Conference
2012 IEEE Nuclear Science Symposium and Medical Imaging Conference
The Nuclear Science Symposium (NSS) offers an outstanding
opportunity for scientists and engineers interested or
actively working in the fields of nuclear science, radiation
instrumentation, software and their applications, to meet
and discuss with colleagues from around the world. The
program emphasizes the latest developments in technology
and instrumentation and their implementation in experiments
for space sciences, accelerators, other radiation
environments, and homeland security.
The Medical Imaging Conference (MIC) is the foremost
international scientific meeting on the physics, engineering
and mathematical aspects of nuclear medicine based imaging.
As the field develops, multi-modality approaches are
becoming more and more important. The content of the MIC
reflects this, with a growing emphasis on the methodologies
of X-ray, optical and MR imaging as they relate to nuclear
imaging techniques. In addition, specialized topics will
be addressed in the Short Courses and Workshops programs.
The Workshop on Room-Temperature Semiconductor Detectors
(RTSD) represents the largest forum of scientists and
engineers developing new semiconductor radiation detectors
and imaging arrays. Room-temperature solid-state radiation
detectors for X-ray, gamma-ray, and neutron radiation are
finding increasing applications in such diverse fields as
medicine, homeland security, astrophysics and environmental
remediation. The objective of this workshop is to provide a
forum for discussion of the state of the art of material
development for semiconductor, scintillator, and organic
materials for detection, materials characterization,
device fabrication and technology, electronics and applications.
Devoted topical short courses are also provided suitable
for students and junior scientists.


