13th UK Annual LOT & J A Woollam Ellipsometry Seminar
Due to the great success of our previous seminars, we are proud to announce the 13th UK J A Woollam Ellipsometry Seminar that will be held on the 9th October 2013 at Mercedes Benz World in Weybridge, Surrey. This seminar is aimed at both experienced ellipsometry users as well as people new to ellipsometry.
The format of the day will include a short introduction in ellipsometry, to show the present status of applications and research. With sample measurements we will demonstrate the power of the Woollam spectroscopic ellipsometers.
With the increasing need to characterise multilayer and multicompound systems in the last few years, the areas where Spectroscopic Ellipsometers are used is permanently growing.This technique allows very sensitive measurement of film thickness, optical constants, composition, surface and interface roughness and many more. Nowadays, it is not only a tool for research and you will recognise an increase of applications close to production. This requirement has been addressed by the development of several in-situ solutions for process monitoring and control.
During the seminar, besides presenting the well-established systems like VASE, M-2000, Apha-SE, we will also show the latest developments to address the requirements of photovoltaic applications and complex measurement and analysis - with graphene being a good example. Systems will be available to demonstrate sample measurements.
There will be a complimentary lunch provided on the day as well as all day refreshments. Delegates are encouraged to register as early as possible as places are limited.
For further details or to register please contact Angela Carslake, e-mail firstname.lastname@example.org or call 01372 378822. Alternatively, please use the online registration form. The agenda will be finalised shortly.