Company details
PI (Physik Instrumente) L.P. Piezo Nano Positioning
16 Albert St.
Auburn,
MA
01501
United States
Tel:
508 832 3456
Product categories
XYZ-Piezo-Scanner Controller for AFM Provides 25 Picometers Resolution Sep 26, 2007
A new ultra-high-resolution positioning & scanning system for AFM Microscopy applications is available from PI. The minute P-363 PicoCube®, together with its ultra-low noise E-536 driver / controller, provide 25 picometers resolution
PI (Physik Instrumente) L.P., a leading manufacturer of nanopositioning and piezo-based precision motion-control equipment for bio-nanotechnology, photonics and semiconductor applications offers a new ultra-high-resolution positioning & scanning system.
The minute P-363 PicoCube®, together with its ultra-low noise E-536 driver / controller, provide significantly higher resolution and positional stability than previous multi-axis scanning stages.
Features & Advantages:
* High-Speed XYZ Scanner for AFM / SPM & Manipulation Tool for Nanotechnology
* Custom, High-Stiffness Shear Piezo Drives Provide up to 10 kHz Resonant Frequency for Faster Response and Higher Scanning Performance
* Ultra-Low-Noise Controller Enables 25 Picometers (0.025 nm) Resolution
* Capacitive Feedback for Exceptional Precision and Linearity
* Parallel Metrology for Better Multi-Axis Accuracy
* Small & Rugged Design with Titanium Case
* Vacuum Compatible
Typical Applications: AFM (Atomic Force Microscopy), SPM (Scanning Probe Microscopy) and Nanomanipulation, Bio-Technology, Nanotechnology, Nano-Imprint, Semiconductor & Data-Storage Test Equipment.
Why are PicoCube® Systems Superior?
PicoCube® systems were designed to overcome the limitations of open-loop piezo-tube based scanners which provide high resolution motion but poor linearity and trajectory guidance.
The compact PicoCube® is based on exceptionally robust, high-stiffness piezo drives rather than tubes and employs non-contact, direct-measuring, parallel-metrology capacitive sensors for position feedback. The low-inertia drives allow for a resonant frequency of 10 kHz, important for high speed scanning applications.
Why Parallel Metrology?
Parallel metrology can “see” all controlled degrees of freedom simultaneously and compensate for off-axis motion in real time. The benefits are a reduction of runout and off-axis errors, straighter multi-axis motion and improved repeatability.
Controller
The new ultra-low-noise E-536 closed-loop controller provides unprecedented positional stability and can be controlled with analog or digital signals. Extensive software support including LabView™ drivers is provided.
About PI
PI is a leading manufacturer of nanopositioning and precision motion-control equipment for photonics, nanotechnology, semiconductor and life science applications. PI has been developing and manufacturing standard & custom precision products with piezoelectric and electromagnetic drives for 35+ years. The company has been ISO 9001 certified since 1994 and provides innovative, high-quality solutions for OEM and research. PI is present worldwide with eight subsidiaries and total staff of 450+.
More products from this company
- Scanning Probe Microscopy / Piezo Stages in Nano-Indentation / Materials Testing Jul 5, 2011
- Nanopositioning Stage Catalog: Piezo System, Motors, Nanopositioning Controller Jun 8, 2011
- AFM Piezo Scanner Catalog: Planar Piezo Stage for Atomic Force Microscopy, SPM Mar 11, 2011
- Piezo Linear Actuator for Automation is Based on Ultrasonic Motor Technology Jan 17, 2011
- Miniature 6-Axis Robot / Parallel Kinematics Hexapod for Precision Alignment Feb 24, 2010
- Super Resolution Microscope Stage: Piezo-Z Slide Scanner Images Faster Jan 29, 2010
- Paper on Imaging Resolution Enhancement / Pixel-Sub-Stepping / with Piezo Nov 23, 2009
- New Piezo Controllers feature fast USB interface with 24-Bit Resolution Oct 6, 2009
- PI News: 2009 Nanopositioning & Piezo Technology Book: Tools for Physicists Mar 9, 2009
- PI Nanopositioning Systems Catalog Offers Precision Motion Control Solutions Jul 31, 2008