Company details
Lake Shore Cryotronics, Inc.
575 McCorkle Blvd
Westerville
OH
43082
United States
Tel:
614-891-2243
Fax:
614-818-1600
Product categories
Model CRTTP6-4K Cryogen-Free Low Vibration Probe Station Sep 21, 2007
This CCR-based probe station uses a 4 K cryogen-free closed cycle refrigerator, eliminating the operating expense of liquid cryogens. Integrated vibration isolation and damping prevent mechanical vibration from affecting its measurement performance.
Lake Shore Cryotronics, Inc. is pleased to introduce the addition of a low vibration cryogen-free micro manipulated probe station to its full line of cryogenic, superconducting magnet-based, electromagnet-based, high vacuum, and load-locked probe stations.
The new CCR-based probe station provides efficient temperature operation and control with a 4 K cryogen-free closed cycle refrigerator, eliminating the operating expense of liquid cryogens. The probe station operates over a standard temperature range of 4.5 K to 350 K, providing excellent temperature stability of 10 mK throughout the full-scale temperature range. An optional interchangeable high temperature sample holder extends the high-end temperature limit to 475 K. Control heaters on the sample stage, 2nd stage cold head, 1st stage riser, and radiation shield provide the probe station with fast thermal response and rapid warm-up for sample exchange — sample exchange cycle time is <3.5 hours.
Careful design consideration was taken to provide a low vibration, user-friendly tool. Integrated vibration isolation and damping prevent mechanical vibration from affecting measurement performance. Sample stage vibration is limited to <1 micron throughout the full-scale temperature range.
The CCR-based probe station is user configurable with up to six ultra-stable micro-manipulated probe arms, each providing precise 3-axis control of the probe position to land the probe tip accurately on device features. Proprietary probe tips in a variety of sizes and materials minimize thermal mass and optimize electrical contact to the device under test (DUT). Probe tips are thermally linked to the cold head to minimize heat transfer to the DUT.
For increased versatility, options include a high temperature sample holder, higher magnification monoscopes, vacuum turbo pumping systems, and fiber optic probe arm modification.
More products from this company
- 8400 Series Hall Effect Measurement System Aug 31, 2011
- Model 8400 Hall Effect Measurement System Aug 31, 2011
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- New Half Rack Temperature Controller Offers 75 W of Low-Noise Heater Power Apr 5, 2011
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- Model 425 Gaussmeter Apr 12, 2010
- Model 425 gaussmeter Apr 12, 2010
- New Temperature Controller Offers Four Standard Inputs and Four Control Outputs Mar 24, 2009
- Lake Shore Far IR Band Pass Filters Specified for NASA’s FORCAST Instrument Mar 24, 2009