![[IOP]](http://images.iop.org/cws/icons/themes/phw/colophon-small.png){kind=icon}
Raman Imaging at the Speed of Light: SWIFTTM and DuoScanTM - New Fast Scanning Raman Technology Dec 11, 2007
HORIBA Jobin Yvon have introduced two new fast Raman scanning technologies. SWIFTTM and DuoScanTM now make incredibly fast Raman imaging a reality
SWIFTTM – “Scanning With Incredibly Fast Times” enables unmatched per pixel measurement times as fast as 7ms. A 50,000 spectrum image can be obtained in 6 minutes. SWIFTTM can be used with a choice of different detectors and uses either standard motorised mapping stages or piezo stages for when very small step sizes are required.
DuoScanTM introduces a revolutionary scanning method. Unique scanning hardware enables the image pixel size to be chosen to match features of interest enabling optimised mapping speeds. Unlike many Raman imaging methods DuoScanTM retains the full confocal advantage of the Raman technique without restriction on laser wavelength.
Combining SWIFTTM and DuoScanTM results in unprecedented fast mapping of large samples. Whole pharmaceutical tablets can be measured in ten minutes or less.
For additional information please contact Dr Adrian Knowles on telephone number 020 8204 8142, email address info@jobinyvon.co.uk or go to www.jobinyvon.com/microanalysis
More products from this company
- Launching the MM-16 NIR, New Spectroscopic Ellipsometer May 6, 2009
- Introducing HORIBA Scientific Apr 22, 2009
- Nobel prize winning filters from Glen Spectra Dec 9, 2008
- DeltaPsi2 Software by HORIBA Jobin Yvon Nov 18, 2008
- The HORIBA Jobin Yvon Auto SE Wins The 2008 IC Industry New System Award Oct 24, 2008
- UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module Jul 9, 2008
- Simple Thin Film Measurement with the Auto SE May 14, 2008
- HORIBA Jobin Yvon introduce the XploRA – the Smart Raman Microscope Apr 9, 2008
- SLICE: A New XRF Methodology and Library for Sample Identification and Archiving Jan 14, 2008
