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KTEI V7.1 Upgrade for Model 4200-SCS Jul 16, 2008
KTEI V7.1 Upgrade for Model 4200-SCS Semiconductor Characterization System Expands C V,
Keithley Instruments,has introduced Keithley Test Environment Interactive (KTEI) V7.1 for the company’s award-winning Model 4200-SCS Semiconductor Characterization System. This software upgrade includes support for testing higher power semiconductor devices.
For more information on this free Model 4200-SCS upgrade, visit http://www.keithley.com/products/semiconductor/?mn=4200-SCS
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