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The HORIBA Jobin Yvon Auto SE Wins The 2008 IC Industry New System Award Oct 24, 2008
The simple spectroscopic ellipsometer for thickness and optical constants of thin/ multi layers.
This new thin film measurement tool has been designed to fulfil thin film quality control requirements. It provides full automation (loading, alignment, mapping), automated selection of 8 different spot sizes down to 25x60 µm and a unique integrated sample vision system. It is controlled by the intuitive Auto Soft software that enables push button thin film analysis for routine operation, with advanced engineering and service modes available for characterising new materials.
More products from this company
- Launching the MM-16 NIR, New Spectroscopic Ellipsometer May 6, 2009
- Introducing HORIBA Scientific Apr 22, 2009
- Nobel prize winning filters from Glen Spectra Dec 9, 2008
- DeltaPsi2 Software by HORIBA Jobin Yvon Nov 18, 2008
- UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module Jul 9, 2008
- Simple Thin Film Measurement with the Auto SE May 14, 2008
- HORIBA Jobin Yvon introduce the XploRA – the Smart Raman Microscope Apr 9, 2008
- SLICE: A New XRF Methodology and Library for Sample Identification and Archiving Jan 14, 2008
- Raman Imaging at the Speed of Light: SWIFTTM and DuoScanTM - New Fast Scanning Raman Technology Dec 11, 2007
