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RHK Technology Expands Nanoscale Research Capability with New SPM Software Jan 9, 2009
RHK announces the release of XPMPro™ 2.0 software for advanced SPM control.
RHK’s SPM1000 universal control electronics, XPMPro provides even greater real-time data acquisition, analysis, and image processing for SPM research. Everyday, in university and government labs around the globe, RHK AFM/STM systems lead to new discoveries in nanotechnology. XPMPro™ is the cornerstone of these systems. The new release allows researchers to manipulate atoms with more control, automatically track individual atoms moving across a surface, compensate for thermal drift in 3 dimensions, and expands advanced spectroscopy techniques.
Adam Kollin, President of RHK, states, “We’ve added new capabilities and advanced solutions to overcome the challenges researchers face as they push the limits of today’s technology. The release of 2.0 ensures that scientists can continue to expand the frontiers of nano-scale research.” Users can visit www.rhk-tech.com to download XPMPro™ 2.0 control software.
For further information please www.rhk-tech.com or contact Allen Vallei of RHK.
Vallei@rhk-tech.com or (248) 577-5426
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