LOT now represent Nanometrics Metrology Systems Feb 18, 2009

- Photoluminescence mapping
- Reflectometers
- Electrochemical Capacitance Voltage Profilers
- Hall Effect Measurement System
- FTIR Metrology

More products from this company

• LOT launch the IBIS Nanoindentation Tester from Fischer Cripps in the UK Nov 14, 2011
• Summer Sale on all ILT Light Meters and Detectors 10% off until End August 2011 Jul 7, 2011
• Excitation Wavelength Selection with a Flick of the Thumb Jun 27, 2011
• Andover's Optical Filters – Prices have been greatly reduced on all filters Jun 20, 2011
• LOT Metrology Promotions on Stylus/Optical Surface Profilers and AFMs Jun 9, 2011
• LOT launch a new online Light Source Catalogue Jun 7, 2011
• A Low Cost Solar Simulator from Abet Technologies May 16, 2011
• The widest choice of Stylus and Optical Profiling tools available today Jun 29, 2010
• NEW Quantum Design PPMS EverCool-II™ – cryogen-free cooling technology May 19, 2010
• New LOT Oriel Tips E-Store Now Open May 6, 2010