Q-View White Light Interferometer / SPM Jul 10, 2009

Q-View is a Dual Technology System featuring SPM / White Light Interferometry on a single integrated platform. SPM mode provides a choice of high resolution scanners for sub-angstrom imaging, as well as closed loop scanners for precise metrology. The Q-View Interferometer module allows high speed large FOV imaging in seconds. Scan stitching enables multiple scans to be stitched together to provide a provide macro view of the sample surface. Q-View is capable of Z height measurements on structures up to 1mm. Scan Atomic real time software runs both SPM mode and Interferometer mode, and Q-Port 3D Rendering software seamlessly images in both SPM and Interferometric modes. Q-View Interferometer module sold separately as upgrade for existing Q-Scope users.

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