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Company details
Ambios Technology Inc
100 Pioneer Street,
Santa Cruz,
CA
95060
United States
Tel:
001 (831) 429 4200
Fax:
001 (831) 427 1160
Product categories
Q-View White Light Interferometer / SPM Jul 10, 2009
Q-View is a Dual Technology System featuring SPM / Interferometry on a single platform. Sub-angstrom imaging and metrology in SPM mode. Large FOV high speed scanning in interferometric mode.
Q-View is a Dual Technology System featuring SPM / White Light Interferometry on a single integrated platform. SPM mode provides a choice of high resolution scanners for sub-angstrom imaging, as well as closed loop scanners for precise metrology. The Q-View Interferometer module allows high speed large FOV imaging in seconds. Scan stitching enables multiple scans to be stitched together to provide a provide macro view of the sample surface. Q-View is capable of Z height measurements on structures up to 1mm. Scan Atomic real time software runs both SPM mode and Interferometer mode, and Q-Port 3D Rendering software seamlessly images in both SPM and Interferometric modes. Q-View Interferometer module sold separately as upgrade for existing Q-Scope users.
