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Launching the MM-16 NIR, New Spectroscopic Ellipsometer May 6, 2009
The MM-16 NIR spectroscopic ellipsometer is dedicated to thin film characterisation determining thickness, optical constants n,k & optical bandgap of materials in the wavelength range 515-1000nm.
MM-16 NIR features a CCD detection system for rapid and accurate measurement down to 1s / determination, and a 200µm microspot allows characterisation of patterned samples. When fully automated the system provides fast uniformity mapping of film thickness & optical constants. The design of the MM-16 NIR is such that it may be configured in several ways & is easy-to-use for demanding research, process development & industrial applications in the photovoltaic, optoelectronic & telecommunication area. It is controlled by the DeltaPsi2 software platform that is common to HORIBA Scientific thin film metrology tools. This provides display of mapping results on semiconductor wafer & glass panels, statistical analysis of data, import/export package function, & data reprocessing capabilities.
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- UVISEL+ RM: Spectroscopic Ellipsometer + with Integrated Reflectometry Module Jul 9, 2008
- Simple Thin Film Measurement with the Auto SE May 14, 2008
- HORIBA Jobin Yvon introduce the XploRA – the Smart Raman Microscope Apr 9, 2008
- SLICE: A New XRF Methodology and Library for Sample Identification and Archiving Jan 14, 2008
- Raman Imaging at the Speed of Light: SWIFTTM and DuoScanTM - New Fast Scanning Raman Technology Dec 11, 2007
