Revolutionary development from NT-MDT Co. Jun 11, 2009

* Use of the most high-end technologies makes it possible for you to increase your data-processing productivity.
* High-performance DSP, fast ADC-s and expanded nomenclature of user inputs/outputs dramatically enrich the available functionality.
* Owing to the modular nature of the controller, it is possible to integrate base boards, providing high-quality SPM capabilities, and additional extension boards inside a uniform system to meet customers’ wishes. This provides maximum flexibility and performance during studies in nanotechnology.
* An automatic feedback adjustment algorithm allows the control-system parameters to be optimized, allowing even an entry-level user to align the controller.

* The scan field size adjustment control system, ScanScaler™, make it is easy to achieve an atomic resolution with a 100x100 micron scanner.
* High-speed scanning is provided by a unique algorithm.
* This next-generation controller is an excellent modular unit for all types of experiment.