CCHAR High-aspect Ratio CNT Probes for Atomic Force Microscopy (AFM) Jun 17, 2009

The CCHAR high-aspect ratio CNT AFM probe, are designed for critical dimension measurements and imaging high-Z structures in materials science, metrology and life science applications. The standard CNT probe length is approximately 1µm overall with < 500nm of exposed CNT tip. These two dimensions can also be custom engineered to user specifications.

C|D|I's carbon core high-aspect ratio probes (CCHAR) for atomic force microscopy (AFM) start with a core carbon nanotube (CNT) and is then further processed and stabilized with patented technology resulting in a CNT probe with maximum aspect ratio, resolution, imaging lifetime and stability.

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