Company details
Zolix Instrument Co., Ltd.
2f, No. 5, Baliqiao South Street
TongZhou Distict
Beijing
101149
China
Tel:
+861060535165
Product categories
Solar Cell Scan 100 QE/IPCE Oct 6, 2009
Full Spectrum Coverage 300-2000nm Vertical Maesurement Optical Bean Path Design Tandem and Multilayer's PV device Characteristic Parallel Bias Beam Path Reflectivity Measurement
Solar Cell Scan100 employed 150W stable Xenon light source, monochromator, order sorting filters, and reflective optics. It provides monochromatic light and software selectable broadband bias light source to a photovoltaic device. The bias source is provided to illuminate the test device to simulate the actual operating environment. Utilization of a bias source will require an AC signal lock-in detection system. The bias source is shuttered when performing the system calibration with the reference detector and then used to bias the test detector and PV solar cell during the measurement. The test detector will respond to this DC light source and the chopped monochromatic beam. System also included motorized stage to complete PV solar cell responsibility uniformity scan up to 156 x156mm.
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