Skip to the content

Innovation & industry

For the latest features and products for those interested in innovation and industry, see our special sections on:

Cryogenics

Fusion

Microscopy

Optics

Sensors

Software

Vacuum

Online lecture series

Strange Genius: The Life and Times of Paul Dirac

Free registration

Company details

Zolix Instrument Co., Ltd.
2f, No. 5, Baliqiao South Street
TongZhou Distict
Beijing
101149
China

Tel: +861060535165

Solar Cell Scan 100 QE/IPCE Oct 6, 2009

Full Spectrum Coverage 300-2000nm Vertical Maesurement Optical Bean Path Design Tandem and Multilayer's PV device Characteristic Parallel Bias Beam Path Reflectivity Measurement

Solar Cell Scan100 employed 150W stable Xenon light source, monochromator, order sorting filters, and reflective optics. It provides monochromatic light and software selectable broadband bias light source to a photovoltaic device. The bias source is provided to illuminate the test device to simulate the actual operating environment. Utilization of a bias source will require an AC signal lock-in detection system. The bias source is shuttered when performing the system calibration with the reference detector and then used to bias the test detector and PV solar cell during the measurement. The test detector will respond to this DC light source and the chopped monochromatic beam. System also included motorized stage to complete PV solar cell responsibility uniformity scan up to 156 x156mm.

 

More products from this company