Available to watch now, IUVSTA, in partnership with Hiden Analytical and Agilent Vacuum Products explore Focused Ion Beam technology
This webinar will show a “fairly new” technology for micro and nano fabrication and characterization. It will discuss the Focused Ion Beam (FIB) technology, a tool available on the market from the early 2000s.
With a FIB it is possible to image and to modify materials at micro and nanoscale by milling and deposition. Despite its complex architecture, it is a relative user-friendly machine, especially when it is included in a dual-beam system with an electron microscope.
Giuseppe Firpo is a physicist and currently a technologist and head of the technical department at Dipartimento di Fisica – Università degli Studi di Genova. He is an expert on vacuum science and technology and has published patents and several scientific papers in peer-review journals on this subject. Since 2005, he has been a FIB user to fabricate nanostructure for biomedical sensing device (Lab on a Chip) and for material science applications. His latest research is on the permeability of ultra-thin membranes for gas separation technology.