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Instrumentation and measurement

Instrumentation and measurement

Focused Ion Beam: a ‘tool’ for micro/nano fabrication and characterization

Available to watch now, IUVSTA, in partnership with Hiden Analytical and Agilent Vacuum Products explore Focused Ion Beam technology

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This webinar will show a “fairly new” technology for micro and nano fabrication and characterization. It will discuss the Focused Ion Beam (FIB) technology, a tool available on the market from the early 2000s.

With a FIB it is possible to image and to modify materials at micro and nanoscale by milling and deposition. Despite its complex architecture, it is a relative user-friendly machine, especially when it is included in a dual-beam system with an electron microscope.

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Giuseppe Firpo is a physicist and currently a technologist and head of the technical department at Dipartimento di Fisica – Università degli Studi di Genova. He is an expert on vacuum science and technology and has published patents and several scientific papers in peer-review journals on this subject. Since 2005, he has been a FIB user to fabricate nanostructure for biomedical sensing device (Lab on a Chip) and for material science applications. His latest research is on the permeability of ultra-thin membranes for gas separation technology.


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