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Materials

Microscopy with momentum – the next-generation photoemission microscopy tool for 2D materials and beyond

19 Aug 2019 Sponsored by Scienta Omicron

Marten Patt studied physics at RWTH Aachen University, and finished his diploma thesis on time- and laterally-resolved spin polarization in semiconductors in 2009. He then joined the group of Claus Schneider at Forschungszentrum Jülich and set up and commissioned one of the first momentum microscopes (NanoESCA) at synchrotron Elettra, Trieste, in early 2011. He also studied the use of hard x-rays for device engineering with a modified NanoESCA (HAXPEEM) at synchrotron DESY, Hamburg. After finishing his PhD in 2016, he started at Scienta Omicron GmbH, Taunustein, as product manager for electron spectroscopy systems, with a focus on ARPES and PEEM/NanoESCA technologies.

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