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Join this webinar to explore easy to use and universal way to measure topography through WLI based optical profiler. This webinar introduces new way to measure surfaces through White Light interferometry profilers. This method combines sub-nanometer vertical resolution while retaining ease of use through self-adapting algorithm matching wide range of surfaces. Benefits will be illustrated via key applications such as academic or R&D multi-user environment, defect inspection on fine optics, orthopedic QA/QC and general texture/roughness measurement on machined parts. Accuracy will be discussed through wide range of roughness standards and calibrated spheres.

Who should attend:
– Researchers
– QA/QC engineer
– Metrology team
– Design engineer

Presenters:

Dr Samuel Lesko
Senior Application Development Manager

Dr Udo Volz
Application Scientist